SPIE Proceedings [SPIE Photonics West '96 - San Jose, CA (Saturday 27 January 1996)] Fabrication, Testing, and Reliability of Semiconductor Lasers - Life tests of Nichia AlGaN/InGaN/GaN blue-light-emitting diodes
Helms, Christopher J., Berg, Niel H., Barton, Daniel L., Osinski, Marek, Fallahi, Mahmoud, Wang, S. C.Volume:
2683
Year:
1996
Language:
english
DOI:
10.1117/12.237678
File:
PDF, 593 KB
english, 1996