SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 1 August 2010)] Developments in X-Ray Tomography VII - Four-dimensional x-ray phase tomography with Talbot interferometer and white synchrotron light
Stock, Stuart R., Momose, Atsushi, Yashiro, Wataru, Harasse, Sebastien, Kuwabara, Hiroaki, Kawabata, KatsuyukiVolume:
7804
Year:
2010
Language:
english
DOI:
10.1117/12.859235
File:
PDF, 8.42 MB
english, 2010