The improvement of nitrogen doped Ge2Sb2Te5 on the phase change memory resistance distributions
Xu, Zhen, Liu, Bo, Chen, Yifeng, Zhang, Zhonghua, Gao, Dan, Wang, Heng, Song, Zhitang, Wang, Changzhou, Ren, Jiadong, Zhu, Nanfei, Xiang, Yanghui, Zhan, Yipeng, Feng, SonglinLanguage:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2015.11.001
Date:
November, 2015
File:
PDF, 1.74 MB
english, 2015