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[IEEE 2015 IEEE Custom Integrated Circuits Conference - CICC 2015 - San Jose, CA, USA (2015.9.28-2015.9.30)] 2015 IEEE Custom Integrated Circuits Conference (CICC) - A flash-based non-uniform sampling ADC enabling digital anti-aliasing filter in 65nm CMOS

Wu, Tzu-Fan, Ho, Cheng-Ru, Chen, Mike Shuo-Wei
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Year:
2015
Language:
english
DOI:
10.1109/CICC.2015.7338381
File:
PDF, 1.11 MB
english, 2015
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