Gate Capacitance Measurement Using a Self-Differential...

IEEE Electron Device Letters 2015 / 12 Vol. 36; Iss. 12

Gate Capacitance Measurement Using a Self-Differential Charge-Based Capacitance Measurement Method

Zhang, Peiyong, Wan, Qing, Feng, Chenhui, Wang, Huiyan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
36
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2015.2490659
Date:
December, 2015
File:
PDF, 883 KB
english, 2015
Conversion to is in progress
Conversion to is failed