H2O trapping on various materials studied by AFM and XPS

H2O trapping on various materials studied by AFM and XPS

Kunihiko Chiba, Rumi Ohmori, Hisashi Tanigawa, Toshiaki Yoneoka, Satoru Tanaka
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Volume:
49-50
Year:
2000
Language:
english
Pages:
7
DOI:
10.1016/s0920-3796(00)00187-3
File:
PDF, 1.39 MB
english, 2000
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