H2O trapping on various materials studied by AFM and XPS
Kunihiko Chiba, Rumi Ohmori, Hisashi Tanigawa, Toshiaki Yoneoka, Satoru TanakaVolume:
49-50
Year:
2000
Language:
english
Pages:
7
DOI:
10.1016/s0920-3796(00)00187-3
File:
PDF, 1.39 MB
english, 2000