SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose, CA (Sunday 15 January 2006)] Image Processing: Algorithms and Systems, Neural Networks, and Machine Learning - Support vector machine as digital image watermark detector

Then, Patrick H.H., Wang, Y. C., Dougherty, Edward R., Astola, Jaakko T., Egiazarian, Karen O., Nasrabadi, Nasser M., Rizvi, Syed A.
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Volume:
6064
Year:
2006
Language:
english
DOI:
10.1117/12.649469
File:
PDF, 390 KB
english, 2006
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