[IEEE 2015 IEEE 20th Conference on Emerging Technologies & Factory Automation (ETFA) - Luxembourg, Luxembourg (2015.9.8-2015.9.11)] 2015 IEEE 20th Conference on Emerging Technologies & Factory Automation (ETFA) - Statistical data mining for efficient quality control in manufacturing
Khan, Abdul Rauf, Schioler, Henrik, Knudsen, Torben, Kulahci, MuratYear:
2015
Language:
english
DOI:
10.1109/ETFA.2015.7301625
File:
PDF, 321 KB
english, 2015