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Mutual Influence of a Deeply Buried Grounding Electrode and the Surrounding Grounding Mesh
Yamamoto, Kazuo, Yoshioka, Kazuki, Sumi, Shinichi, Yanagawa, Shunichi, Sekioka, ShozoVolume:
51
Language:
english
Journal:
IEEE Transactions on Industry Applications
DOI:
10.1109/TIA.2015.2409251
Date:
November, 2015
File:
PDF, 1001 KB
english, 2015