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[IEEE 2014 3rd International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions) - Noida, India (2014.10.8-2014.10.10)] Proceedings of 3rd International Conference on Reliability, Infocom Technologies and Optimization - Innovation diffusion models incorporating time lag between innovators and imitators adoption
Singh, Ompal, Kapur, P.K., Sachdeva, Nitin, Bibhu, VimalYear:
2014
Language:
english
DOI:
10.1109/ICRITO.2014.7014710
File:
PDF, 1.03 MB
english, 2014