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[IEEE 2015 XVIII International Conference on Soft Computing and Measurements (SCM) - St. Petersburg, Russia (2015.5.19-2015.5.21)] 2015 XVIII International Conference on Soft Computing and Measurements (SCM) - Modeling the external electromagnetic influences on the complex electronic equipment
Chermoshencev, S. F., Gaynutdinov, R. R.Year:
2015
Language:
english
DOI:
10.1109/SCM.2015.7190420
File:
PDF, 605 KB
english, 2015