SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Industrial Optical Sensors for Metrology and Inspection - Computer-aided measurement of thread accuracy with a toolmaker's microscope
Yu, Hui-Fen, Liu, Shou-Bin, Xiang, Ke-Jun, Harding, Kevin G., Stahl, H. PhilipVolume:
2349
Year:
1995
Language:
english
DOI:
10.1117/12.198694
File:
PDF, 325 KB
english, 1995