SPIE Proceedings [SPIE 1978 Technical Symposium East - Washington, D.C. (Tuesday 28 March 1978)] Applications of Electronic Imaging Systems - Automatic Surface Flaw Inspection Of Nuclear Fuel Pellets
McLemore, D. R., Nyman, D. H., Wilks, R. S., Franseen, Richard E., Schroder, Dieter K.Volume:
143
Year:
1978
Language:
english
DOI:
10.1117/12.956558
File:
PDF, 148 KB
english, 1978