![](/img/cover-not-exists.png)
Beam test measurements on GaAs pixel detectors at various angles of incidence
W. Braunschweig, J. Breibach, D. Gräßel, St. König, Th. Kubicki, K. Lübelsmeyer, C. Rente, Ch. Röper, R. Siedling, O. Syben, F. Tenbusch, M. Toporowski, W.J. XiaoVolume:
78
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0920-5632(99)00594-0
File:
PDF, 395 KB
english, 1999