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[IEEE 2015 IEEE Custom Integrated Circuits Conference - CICC 2015 - San Jose, CA, USA (2015.9.28-2015.9.30)] 2015 IEEE Custom Integrated Circuits Conference (CICC) - ADC trends and impact on SAR ADC architecture and analysis

Fredenburg, Jeffrey, Flynn, Michael P.
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Year:
2015
Language:
english
DOI:
10.1109/CICC.2015.7338380
File:
PDF, 2.97 MB
english, 2015
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