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SPIE Proceedings [SPIE Selected Proceedings of the Photoelectronic Technology Committee Conferences held August-October 2014 - China, China (Friday 1 August 2014)] Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I - Measurement and analysis on ion barrier film of MCP by ion beam sputtering deposition
Hou, Xun, Wang, Zhihong, Wu, Lingan, Ma, Jing, Zhang, Ni, Zhu, Yu-Feng, Li, Dan, Nie, Jing, Zhang, Fan, Zhang, Tai-min, Liu, Xiao-jian, Liu, Zhao-lu, Cheng, Wei, Chen, ChangVolume:
9521
Year:
2015
Language:
english
DOI:
10.1117/12.2177787
File:
PDF, 596 KB
english, 2015