Gap Junctions Formed by Connexins 26 and 32 Alone and in...

Proceedings of the National Academy of Sciences 1991 / 10 Vol. 88; Iss. 19

Gap Junctions Formed by Connexins 26 and 32 Alone and in Combination are Differently Affected by Applied Voltage

Luis C. Barrio, Thomas Suchyna, Thaddeus Bargiello, Lie Xian Xu, Raymond S. Roginski, Michael V. L. Bennett and Bruce J. Nicholson
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Volume:
88
Language:
english
Journal:
Proceedings of the National Academy of Sciences of the United States of America
DOI:
10.2307/2357949
Date:
October, 1991
File:
PDF, 1.04 MB
english, 1991
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