[IEEE 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - Suzhou, China (2015.7.1-2015.7.3)] 2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - RCS reduction by metasurface with random distribution of reflection phases

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