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[IEEE 2015 IEEE Radiation Effects Data Workshop (REDW) - Boston, MA, USA (2015.7.13-2015.7.17)] 2015 IEEE Radiation Effects Data Workshop (REDW) - Radiation Test Results for Common CubeSat Microcontrollers and Microprocessors
Guertin, Steven M., Amrbar, Mehran, Vartanian, SergehYear:
2015
Language:
english
DOI:
10.1109/REDW.2015.7336730
File:
PDF, 382 KB
english, 2015