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Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy
Chen, Ran, Hu, Keke, Yu, Yun, Mirkin, Michael V., Amemiya, ShigeruVolume:
163
Year:
2016
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/2.0071604jes
File:
PDF, 516 KB
english, 2016