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Radiation-induced defects in n-type GaN and InN
V.V. Emtsev, V.Yu. Davydov, E.E. Haller, A.A. Klochikhin, V.V. Kozlovskii, G.A. Oganesyan, D.S. Poloskin, N.M. Shmidt, V.A. Vekshin, A.S. UsikovVolume:
308-310
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0921-4526(01)00650-0
File:
PDF, 151 KB
english, 2001