In-plane and in-depth nonuniformities in defect distribution in GaN and InGaN epilayers
M. Godlewski, E.M. Goldys, G. Pozina, B. Monemar, K. Pakula, J.M. Baranowski, P. Prystawko, M. LeszczynskiVolume:
308-310
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0921-4526(01)00671-8
File:
PDF, 164 KB
english, 2001