Investigation of Forming, SET, and Data Retention of...

IEEE Transactions on Electron Devices 2015 / 11 Vol. 62; Iss. 11

Investigation of Forming, SET, and Data Retention of Conductive-Bridge Random-Access Memory for Stack Optimization

Guy, Jeremy, Molas, Gabriel, Blaise, Philippe, Bernard, Mathieu, Roule, Anne, Le Carval, Gilles, Delaye, Vincent, Toffoli, Alain, Ghibaudo, Gerard, Clermidy, Fabien, De Salvo, Barbara, Perniola, Luca
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2476825
Date:
November, 2015
File:
PDF, 3.29 MB
english, 2015
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