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Influence of electron–electron scattering on the hot electron distribution in ultra-short Si-MOSFETs
J. Jakumeit, U. RavaioliVolume:
314
Year:
2002
Language:
english
Pages:
4
DOI:
10.1016/s0921-4526(01)01426-0
File:
PDF, 80 KB
english, 2002