[IEEE 2015 13th International Conference on Document...

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[IEEE 2015 13th International Conference on Document Analysis and Recognition (ICDAR) - Tunis, Tunisia (2015.8.23-2015.8.26)] 2015 13th International Conference on Document Analysis and Recognition (ICDAR) - Automated analysis of line plots in documents

Nair, Rathin Radhakrishnan, Sankaran, Nishant, Nwogu, Ifeoma, Govindaraju, Venu
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Year:
2015
Language:
english
DOI:
10.1109/ICDAR.2015.7333871
File:
PDF, 773 KB
english, 2015
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