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[IEEE 2015 IEEE MTT-S International Microwave Symposium (IMS2015) - Phoenix, AZ, USA (2015.5.17-2015.5.22)] 2015 IEEE MTT-S International Microwave Symposium - Simple creep parameters extraction in metal contact RF-MEMS switches

Lemoine, E., Pothier, A., Crunteanu, A., Blondy, P., Saillen, N., Marchand, L.
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Year:
2015
Language:
english
DOI:
10.1109/MWSYM.2015.7167008
File:
PDF, 484 KB
english, 2015
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