[IEEE 2015 IEEE International Symposium on Electromagnetic Compatibility - EMC 2015 - Dresden, Germany (2015.8.16-2015.8.22)] 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) - Contributing factors in the final performance of a common mode choke
Roc'h, Anne, Leferink, FrankYear:
2015
Language:
english
DOI:
10.1109/ISEMC.2015.7256143
File:
PDF, 826 KB
english, 2015