Analysis of Far-Out Spurious Noise and its Reduction in...

IEEE Transactions on Microwave Theory and Techniques 2015 / 12 Vol. 63; Iss. 12

Analysis of Far-Out Spurious Noise and its Reduction in Envelope-Tracking Power Amplifier

Kim, Jooseung, Kim, Dongsu, Cho, Yunsung, Kang, Daehyun, Park, Byungjoon, Moon, Kyunghoon, Kim, Bumman
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Volume:
63
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2015.2495178
Date:
December, 2015
File:
PDF, 3.21 MB
english, 2015
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