SPIE Proceedings [SPIE Sixth International Conference on Electronics and Information Engineering - Dalian, China (Saturday 26 September 2015)] Sixth International Conference on Electronics and Information Engineering - Experimental study on the relationship between the seeding rate and seeding performance of the seed metering device
Zhang, Qiang, Niu, Yuanyuan, Li, He, Xu, Mingchen, Zhang, Kaifei, Yu, YongchangVolume:
9794
Year:
2015
Language:
english
DOI:
10.1117/12.2203493
File:
PDF, 369 KB
english, 2015