Temperature and angular dependence of the upper critical field of UPd2Al3 thin films
J. Hessert, M. Huth, M. Jourdan, H. Adrian, C.T. Rieck, K. ScharnbergVolume:
230-232
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0921-4526(96)00725-9
File:
PDF, 233 KB
english, 1997