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[IEEE 2015 IEEE Conference on Visual Analytics Science and Technology (VAST) - Chicago, IL, USA (2015.10.25-2015.10.30)] 2015 IEEE Conference on Visual Analytics Science and Technology (VAST) - Tell me what do you see: Detecting perceptually-separable visual patterns via clustering of image-space features in visualizations
Reda, Khairi, Gonzalez, Alberto, Leigh, Jason, Papka, Michael E.Year:
2015
Language:
english
DOI:
10.1109/VAST.2015.7347683
File:
PDF, 1.69 MB
english, 2015