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Investigation of the crystal structure of URu2Si2 by high-resolution X-ray diffraction
N. Kernavanois, P.Dalmas de Réotier, A. Yaouanc, J.-P. Sanchez, K.D. Liß, P. LejayVolume:
259-261
Year:
1999
Language:
english
Pages:
2
DOI:
10.1016/s0921-4526(98)01005-9
File:
PDF, 70 KB
english, 1999