Influence of non-linear effects on very short pMOSFET device performances
Patrice Houlet, Yuji Awano, Naoki YokoyamaVolume:
272
Year:
1999
Language:
english
Pages:
3
DOI:
10.1016/s0921-4526(99)00341-5
File:
PDF, 120 KB
english, 1999