Defect formation near GaN surfaces and interfaces
L.J Brillson, T.M Levin, G.H Jessen, A.P Young, C Tu, Y Naoi, F.A Ponce, Y Yang, G.J Lapeyre, J.D MacKenzie, C.R AbernathyVolume:
273-274
Year:
1999
Language:
english
Pages:
5
DOI:
10.1016/s0921-4526(99)00409-3
File:
PDF, 159 KB
english, 1999