Defect introduction in epitaxially grown n-GAN during electron beam deposition of Ru schottky contacts
F.D Auret, S.A Goodman, G Myburg, F.K Koschnick, J.-M Spaeth, B Beaumont, P GibartVolume:
273-274
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0921-4526(99)00412-3
File:
PDF, 132 KB
english, 1999