Microscopic properties of H2 in Si from the dependence of the 3618.4 cm−1 line on temperature and stress
J Anna Zhou, E Chen, Michael StavolaVolume:
273-274
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0921-4526(99)00445-7
File:
PDF, 139 KB
english, 1999