Spectroscopic probing of defect-related energy storage in silicon doped with erbium
D.T.X Thao, T Gregorkiewicz, J.M LangerVolume:
273-274
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0921-4526(99)00467-6
File:
PDF, 118 KB
english, 1999