Defect states at silicon surfaces
A.J. Reddy, J.V. Chan, T.A. Burr, R. Mo, C.P. Wade, C.E.D. Chidsey, J. Michel, L.C. KimerlingVolume:
273-274
Year:
1999
Language:
english
Pages:
5
DOI:
10.1016/s0921-4526(99)00527-x
File:
PDF, 211 KB
english, 1999