Effects of extended defects on the properties of intrinsic and extrinsic point defects in silicon
J.F Justo, A Antonelli, T.M Schmidt, A FazzioVolume:
273-274
Year:
1999
Language:
english
Pages:
3
DOI:
10.1016/s0921-4526(99)00528-1
File:
PDF, 80 KB
english, 1999