Electron irradiation effects in Si observed at 4.2–25 K by means of in situ transmission electron microscopy
S. Takeda, J. Yamasaki, Y. KimuraVolume:
273-274
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0921-4526(99)00529-3
File:
PDF, 591 KB
english, 1999