Do structural defects affect semiconducting properties of fullerene thin films?
E.A Katz, A.I Shames, D Faiman, S Shtutina, Y Cohen, S Goren, W Kempinski, L Piekara-SadyVolume:
273-274
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0921-4526(99)00558-x
File:
PDF, 119 KB
english, 1999