Defect diagnostics using scanning photoluminescence in...

Physica B: Condensed Matter 1999 Vol. 273-274; Iss. none

Defect diagnostics using scanning photoluminescence in multicrystalline silicon

I Tarasov, S Ostapenko, V Feifer, S McHugo, S.V Koveshnikov, J Weber, C Haessler, E.-U Reisner
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Volume:
273-274
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0921-4526(99)00570-0
File:
PDF, 239 KB
english, 1999
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