Native point defect analysis in non-stoichiometric GaAs: an...

Native point defect analysis in non-stoichiometric GaAs: an annealing study

R.C Lutz, P Specht, R Zhao, O.H Lam, F Börner, J Gebauer, R Krause-Rehberg, E.R Weber
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Volume:
273-274
Year:
1999
Language:
english
Pages:
3
DOI:
10.1016/s0921-4526(99)00621-3
File:
PDF, 96 KB
english, 1999
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