Impact of induced lattice defects on performance degradation of AlGaAs/GaAs p-HEMTs
T Hakata, H Ohyama, S Kuroda, E Simoen, C Claeys, T Kudou, K Kobayashi, M Nakabayashi, M Yoncoka, Y Takami, H Sunaga, K MiyaharaVolume:
273-274
Year:
1999
Language:
english
Pages:
3
DOI:
10.1016/s0921-4526(99)00632-8
File:
PDF, 104 KB
english, 1999