Space technology from X-ray telescopes for focusing SANS and reflectometry
B Alefeld, L Dohmen, D Richter, Th BrückelVolume:
276-278
Year:
2000
Language:
english
Pages:
3
DOI:
10.1016/s0921-4526(99)01323-x
File:
PDF, 119 KB
english, 2000