Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data
U Pietsch, N Darowski, A Ulyanenkov, J Grenzer, K.H Wang, A ForchelVolume:
283
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0921-4526(99)01898-0
File:
PDF, 175 KB
english, 2000