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SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Optical Inspection and Micromeasurements - Near-field study of magneto-optical samples: theoretical comparison of transversal and polar effects
Van Labeke, Daniel, Vial, A., Barchiesi, Dominique, Gorecki, ChristopheVolume:
2782
Year:
1996
Language:
english
DOI:
10.1117/12.250786
File:
PDF, 1.10 MB
english, 1996