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Characterization of YBa2Cu3O7−δ films grown on NiO buffer layer by liquid-phase epitaxy process
Toshihiko Maeda, SeokBeom Kim, Toshihiro Suga, Haruhiko Kurosaki, Toyotaka Yuasa, Yasuji Yamada, Tomonori Watanabe, Kaname Matsumoto, Izumi HirabayashiVolume:
357-360
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0921-4534(01)00528-7
File:
PDF, 185 KB
english, 2001