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Localized measurement of penetration depth for a high Tc superconductor single crystal using a magnetic force microscope
Qingyou Lu, Koki Mochizuki, John T Markert, Alex de LozanneVolume:
371
Year:
2002
Language:
english
Pages:
5
DOI:
10.1016/s0921-4534(01)01067-x
File:
PDF, 130 KB
english, 2002