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[IEEE 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2015.9.27-2015.10.2)] 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - How Six Sigma brought saving and improved manufacturing process by 98.9%
Drab, Kamil, Kwiatkowski, Mariusz, Wasalaski, PhilipYear:
2015
Language:
english
DOI:
10.1109/EOSESD.2015.7314776
File:
PDF, 1.13 MB
english, 2015